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Applied Mathematics and Nonlinear Sciences
Volume 10 (2025): Issue 1 (January 2025)
Open Access
Automatic Identification of Surface Defects in Semiconductor Materials Based on Machine Learning
Huan Li
Huan Li
University of Electronic Science and Technology of China
Chengdu, China
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Li, Huan
Mar 17, 2025
Applied Mathematics and Nonlinear Sciences
Volume 10 (2025): Issue 1 (January 2025)
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Published Online:
Mar 17, 2025
Received:
Oct 08, 2024
Accepted:
Feb 04, 2025
DOI:
https://doi.org/10.2478/amns-2025-0271
Keywords
Machine learning
,
Canny operator
,
TensorFlow framework
,
Five-fold cross-validation
,
Defect recognition
© 2025 Huan Li, published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
