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Automatic Identification of Surface Defects in Semiconductor Materials Based on Machine Learning

Huan Li

Huan Li

University of Electronic Science and Technology of ChinaChengdu, China
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Li, Huan
  
Mar 17, 2025
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Published Online: Mar 17, 2025
Received: Oct 08, 2024
Accepted: Feb 04, 2025
DOI: https://doi.org/10.2478/amns-2025-0271
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© 2025 Huan Li, published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
Li, Huan
University of Electronic Science and Technology of ChinaChengdu, China
Language:
English
Publication timeframe:
1 times per year
Journal Subjects:
Life Sciences, Life Sciences, other, Mathematics, Applied Mathematics, General Mathematics, Physics, Physics, other
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