Pattern Recognition and Algorithm Improvement for Error Analysis in Voltage Transformer Low Voltage Testers
, , , , , oraz
27 lis 2024
O artykule
Data publikacji: 27 lis 2024
Otrzymano: 03 lip 2024
Przyjęty: 22 paź 2024
DOI: https://doi.org/10.2478/amns-2024-3506
Słowa kluczowe
© 2024 Xu Chen et al., published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
Chen, Xu
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Haomiao
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Chao
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Cheng, Zhiqiang
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Xu, Yinzhe
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Yan, Yu
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Xinrui
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China