Accès libre

Pattern Recognition and Algorithm Improvement for Error Analysis in Voltage Transformer Low Voltage Testers

, , , , ,  et   
27 nov. 2024
À propos de cet article

Citez
Télécharger la couverture

Chen, Xu
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Haomiao
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Chao
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Cheng, Zhiqiang
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Xu, Yinzhe
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Yan, Yu
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Xinrui
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China