Pattern Recognition and Algorithm Improvement for Error Analysis in Voltage Transformer Low Voltage Testers
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27 nov 2024
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Publicado en línea: 27 nov 2024
Recibido: 03 jul 2024
Aceptado: 22 oct 2024
DOI: https://doi.org/10.2478/amns-2024-3506
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© 2024 Xu Chen et al., published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
Chen, Xu
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Haomiao
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Chao
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Cheng, Zhiqiang
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Xu, Yinzhe
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Yan, Yu
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China
Zhang, Xinrui
State Grid Ningxia Marketing Service Center (State Grid Ningxia Metrology Center)Yinchuan, China