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Application and Feasibility Assessment of Artificial Intelligence in Forensic Identification and Document Examination

Jing Ye

Jing Ye

College of Policing Studies, Shanghai University of Political Science and LawChina
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Ye, Jing
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Leya Zhang

Leya Zhang

Mental Health Education and Counseling Center, Shanghai University of Medicine and Health SciencesChina
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Zhang, Leya
  
29 sept. 2025
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Publié en ligne: 29 sept. 2025
Reçu: 17 janv. 2025
Accepté: 27 avr. 2025
DOI: https://doi.org/10.2478/amns-2025-1127
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© 2025 Jing Ye and Leya Zhang, published by Sciendo.
This work is licensed under the Creative Commons Attribution 4.0 International License.

Figure 1.

The polar coordinate representation of the line
The polar coordinate representation of the line

Figure 2.

Results of Hough line transformation
Results of Hough line transformation

Figure 3.

Indentation depth curves of the No. 1 writer under five pad conditions
Indentation depth curves of the No. 1 writer under five pad conditions

Figure 4.

Indentation depth curves of writer 1 under pad condition for 10 A4 sheets
Indentation depth curves of writer 1 under pad condition for 10 A4 sheets

Figure 5.

Results of LBP feature factor analysis for the full image of character images
Results of LBP feature factor analysis for the full image of character images

Figure 6.

Results of characteristic factor analysis of character LBP
Results of characteristic factor analysis of character LBP

Figure 7.

Results of Raman spectrum analysis
Results of Raman spectrum analysis

Comparison results of Hough line changes

Image Entropy of information Ultimate compression ratio
Image 1 6.9735 1.203
Wavelet transform 5.0382 1.703
Fourier transform 4.0284 2.198
Hough line transform 2.7653 2.974
Image 2 7.0843 1.148
Wavelet transform 4.8863 1.718
Fourier transform 3.7826 2.286
Hough line transform 2.5973 2.864
Image 3 7.1084 1.129
Wavelet transform 4.8691 1.711
Fourier transform 3.7742 2.689
Hough line transform 2.5038 2.903
Langue:
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Sciences de la vie, Sciences de la vie, autres, Mathématiques, Mathématiques appliquées, Mathématiques générales, Physique, Physique, autres
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