Detection of Apparent Defects in HPLC/Dual Mode Portable Sorting Device Based on Deep Learning and Image Processing

Publicado en línea: 31 ene 2024

Recibido: 11 dic 2023

Aceptado: 21 dic 2023

DOI: https://doi.org/10.2478/amns-2024-0029

Palabras clave

<kwd>Deep learning</kwd>, <kwd>Image processing</kwd>, <kwd>Dual mode communication</kwd>, <kwd>Defect detection</kwd>, <kwd>Sorting device</kwd>

© 2024 Peng Wang et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.