Detection of Apparent Defects in HPLC/Dual Mode Portable Sorting Device Based on Deep Learning and Image Processing

Published Online: Jan 31, 2024

Received: Dec 11, 2023

Accepted: Dec 21, 2023

DOI: https://doi.org/10.2478/amns-2024-0029

Keywords

<kwd>Deep learning</kwd>, <kwd>Image processing</kwd>, <kwd>Dual mode communication</kwd>, <kwd>Defect detection</kwd>, <kwd>Sorting device</kwd>

© 2024 Peng Wang et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.