Pattern Recognition and Algorithm Improvement for Error Analysis in Voltage Transformer Low Voltage Testers

Online veröffentlicht: 27. Nov. 2024

Eingereicht: 03. Juli 2024

Akzeptiert: 22. Okt. 2024

DOI: https://doi.org/10.2478/amns-2024-3506

Schlüsselwörter

<kwd>Voltage transformer</kwd>, <kwd>Resonant CVT analysis</kwd>, <kwd>Low voltage test</kwd>, <kwd>Neural network</kwd>, <kwd>Error analysis</kwd>

© 2024 Xu Chen et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.