Optimization of Machine Learning-based Value Assessment Model in High Value Patent Cultivation in Universities
03 sept 2024
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Publicado en línea: 03 sept 2024
Recibido: 22 mar 2024
Aceptado: 16 jul 2024
DOI: https://doi.org/10.2478/amns-2024-2572
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© 2024 Yihang Wei, published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
Wei, Yihang
Shaoxing University Yuanpei CollegeShaoxing, China